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KSI v450E 大型超高分辨超声无损检测仪
The all new KSI v450E Scanning Acoustic Microscope for DBC board, IGBT module, solar panel, multi wafer and other large sample inspections. The new v450E combines KSI’s unmatched high speed scanning and unique vibration decoupling granite design with an extra large scanning range of 450mm x 450mm. With the KSI v450E easy handling and fast evaluation of large size samples is guaranteed.
The KSI v450E Key-Features:
• Extra large 450mm x 450mm scan field for DBC substrate / IGBT module / PCB
• Extra thickened marble base and deepened water tank make it easier to full auto- and semi auto- the testing of DBC substrates and IGBT modules
• New Highly Ergonomic, User-friendly Design with Wide Cover Opening for Easy Large Size Sample Handling
• Perfectly suitable for large sample inspections including DBC, IGBT, PCB boards, solar panel, multi wafer and all other large size and standard applications
Simultaneous Multi JEDEC Tray Scanning for all standard.
• All-in-one Scanning Acoustic Microscope for inspection of PCB, multiple jedec, flip chip, stacked DIE, DBC, IGBT, multi wafer, MLCC, solar cells, and other semiconductor as well as material science applications
• Matchless vibration decoupling granite design and high speed linear drive with max. moving speed 2,000 mm/s, and maximum acceleration 30,000 mm/s²
• Unique FCT™ (Fluid Cut Technology) Transducer
Available options:
• Customer Specific Tray Fixture for all Applications (wafer, jedec, BGA‘s, DBC, IGBT, Flip Chip etc.)
• Constant Coupling Liquid Quality with DI-Water Refill Unit and Water Purity Control
• Elimination of Contaminations and Gas Bubbles in Coupling Liquid for Highest Picture Quality and Stable Scan-Process
• Automation of Sample Positioning, Scan Process, Failure Detection, Analysis & Quantification
IP-holding GmbH, Walther-Rathenau-Str.18, 35745, Herborn, Germany.
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扫描声学显微镜
